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Are pinholes the cause of excess current in superconducting tunnel junctions? A study of Andreev current in highly resistive junctions

机译:针孔是超导隧道中过电流的原因   路口?高电阻结中andreev电流的研究

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摘要

In highly resistive superconducting tunnel junctions, excess subgap currentis usually observed and is often attributed to microscopic "pinholes" in thetunnel barrier. We have studied the subgap current insuperconductor-insulator-superconductor (SIS) andsuperconductor-insulator-normal-metal (SIN) junctions. In Al/AlOx/Al junctions,we observed a decrease of 2 orders of magnitude in the current upon thetransition from the SIS to the SIN regime, where it then matched theory. InAl/AlOx/Cu junctions, we also observed generic features of coherent diffusiveAndreev transport in a junction with a homogenous barrier. We use thequasiclassical Keldysh-Green function theory to quantify single- andtwo-particle tunneling and find good agreement over 2 orders of magnitude intransparency. We argue that our observations rule out pinholes as the origin ofthe excess current.
机译:在高电阻超导隧道结中,通常会观察到过大的亚间隙电流,并且通常归因于隧道势垒中的微观“针孔”。我们研究了超导体-绝缘体-超导体(SIS)和超导体-绝缘体-正常金属(SIN)结的亚间隙电流。在Al / AlOx / Al结中,我们观察到从SIS过渡到SIN体制后电流减小了2个数量级,然后与理论相符。在Al / AlOx / Cu结中,我们还观察到在具有均匀势垒的结中相干扩散Andreev传输的一般特征。我们使用准经典的Keldysh-Green函数理论对单粒子和双粒子隧穿进行量化,并在2个数量级的不透明性中找到了良好的一致性。我们认为,我们的观察结果排除了过大电流起源的针孔。

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